The 300kV JEOL GrandARM-300F is one of four microscopes providing unprecedented new nuclear science research capabilities to analyze and characterize radiological materials. Located in the Radiochemical Processing Laboratory, the instrument’s mission is atomic-scale imaging and chemical and compositional materials analysis on structural alloys, fuel assemblies, electronic materials, and catalysts.
In the brief time since it began operations at PNNL, researchers have:
- Demonstrated how advanced detectors enable mapping of fission gas products in spent fuel, helping us to better understand and model decay of waste.
- Provided Ab initio modeling based on atomic-scale imaging to identify how structural distortions mediate radiation damage in pyrochlore oxides.
- Produced the first report of atomic-scale spectroscopy of any actinide, thus giving us direct insight into uraninite surface oxidation.
- 80 – 300 kV accelerating voltage
- 63 pm spatial resolution
- Dual JEOL Centurio energy-dispersive X-ray spectrometers (1.63 sr solid angle)
- GIF Quantum 665 electron energy loss spectrometer
- Array of sample stages for tilting, tomography, heating, and cooling
Spurgeon SR, TC Kaspar, V Shutthanandan, J Gigax, L Shao, and M Sassi. 2020. "Oxide Interfaces in Disarray: Asymmetric Lattice Disorder induced at Oxide Interfaces." Advanced Materials Interfaces, Vol. 7 1901944.